Aehr Test Systems gets follow-on order for FOX-XP Test and Burn-in System
Aehr Test Systems announced that it has received a $2.1M follow-on order from one of its lead FOX-XP Test and Burn-in System customers for a FOX-XP System to provide additional test capacity for the customer's increasing silicon photonics device production requirements. The FOX-XP System is expected to ship within the next six months. The FOX-XP system is configurable with up to eighteen FOX-P independent testers respectively each with their own independent test system, test interface, and conductive thermal chuck. The FOX-XP test and burn-in systems enable full wafer contact of eighteen wafers in parallel at 90% smaller footprint than traditional semiconductor test systems that can test a maximum of only one wafer at a time. Gayn Erickson, President and CEO of Aehr Test Systems, commented, "We are excited to receive this follow-on order for an additional FOX-XP system and to continue to work closely with this customer, one of the world's largest semiconductor manufacturers, to support their production ramp in wafer-level burn-in capacity. This customer is forecasting significant growth in shipments for silicon photonics devices that we expect to drive the need for additional production test and burn-in capacity for multiple years into the future.